The structure of copper phthalocyanine thin films and copper phthalocyanine-polystyrene composite was investigated by atomic force microscopy (AFM). The results are compared with sensor properties of the investigated films.

"Physics, Chemistry and Application of Nanostructures (Reviews and short notes to Nanomeeting '99)". Ed by V. E. Borisenko, A. B. Filonov, S. V. Gaponenko, V. S. Gurin. Singapore, New Jersey, London, Hong Kong: Word Scientific Publishing Co., 1999. pp. 221-224