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Overall view of FemtoScan mechanical system |
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The main base
of the mechanical system
(precise piezoscanner and step motor are inside the tubular box) |
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FemtoScan
STM option |
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FemtoScan
AFM option |
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FemtoScan STM was launched on 28.04.1997
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FemtoScan Specifications
FemtoScan AFM/STM main base
True vertical probe/sample initial approach
Initial approach — step motor
Initial approach range — up to 4 mm
Initial approach step size — 30 nm
Typical thermal drift — less than 1 nm/s
Sample position — horizontal
Sample size — up to 15 mm in diameter, 5 mm in height
Scan size — 2 m or 10 m
Scan rate — up to 30 Hz
Sample holder — magnetic
FemtoScan STM Head
Height, Deflection, I(U), I(Z) Modes
Interleave, DualTrace, Lithography Modes
Tunnel current ranges — 10 pA - 20 nA, 0.01 pA - 1 nA
Bias voltage ±10 V
Tip diameter 0. 1 - 0.4 mm
Resolution atomic on graphite
FemtoScan AFM Head
Height, Deflection and Friction Modes
Resolution — atomic on mica
Resonant Modes (semi-contact)
Lift, Interleave, DualTrace, Lithography Modes
FemtoScan Controller Electronics
Data and feedback control using Digital Signal Processor with a 133 MHz frequency for arithmetic operations
X, Y, and Z high voltage amplifiers with ±135 V output range
Four precise DACs with 16 bit resolution and 10 ms acquisition time for X, Y, Z, and U signals, 12 optional DACs
Two input ADCs with 16 bit resolution and 10 ms acquisition time
Tunnel voltage amplifier with ±10 V output range
FemtoScan Sample Heater (optional)
Temperature rate — up to 80 oC
Temperature accuracy — 0,05 oC
Thermal drift during heating (max):
— 100 nm/ oC (normal direction), 40 nm/ oC (lateral direction)
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